85. Basic Study on Spiral Scan using Fast CT scanner
نویسندگان
چکیده
منابع مشابه
Fast spiral-scan atomic force microscopy.
In this paper, we describe a new scanning technique for fast atomic force microscopy. In this method, the sample is scanned in a spiral pattern instead of the well established raster pattern. A spiral scan can be produced by applying single frequency cosine and sine signals with slowly varying amplitudes to the x-axis and y-axis of an atomic force microscope (AFM) scanner respectively. The use ...
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ژورنال
عنوان ژورنال: Japanese Journal of Radiological Technology
سال: 1992
ISSN: 0369-4305,1881-4883
DOI: 10.6009/jjrt.kj00003500483